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Peter Hoffmann

577-4573
hoffmann@wayne.edu

Area of Interest
Development of high sensitivity scanning probe techniques; Nanomechanics & nano-tribology; in-situ Atomic Force Microscopy (AFM) in liquids; high resolution biological imaging; nanomechanics of biomolecules & structures.

Resources
Scanning Probe Microscopy: UHV STM/AFM, ambient AFM;Thin film evaporator, Electrochemistry

Collaboration Interests:
Personally need collaborators with background in biochemistry, biomolecular structure & Synthesis of nanostructures; Best if people are available nearby, but long distance also possible.